I am new to this forum. I hae some issues while taking some image from AFM. I am trying to get image in tapping mode.
1. In one of my samply -it consists of nano features. While scanning in 5 micron scan size it gives the feature height 150 +/- 10 nm . But as soon as I changed the scan size to 2 micron , the feature height extracted from the cross sectional analysis become double. I could not find the reason. Please help to resole this issue.
2. While trying to scan a sample made on stain less steel substrate, I find it difficult to get an image. What I noticed is that
a> The Z centre is fluctuating greatly. Its swinging from retacted position to extended region and and it was nt possible to bring the z centre within the allowable limit by using stepper motor controller. We played with Integral gain , Scan Rate and Amplitude set point. But nothing workied.
b> While cutting the SS sample with seisures, there are some high unevenness around the edge of the sample. Is it happenning due to this?
Looking for your valuable suggestion.